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Evolution des dépôts
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Type
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Domaines HAL
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Derniers dépôts
Mots clés
Oxide interface
Silicon photonics
Lifetime
Thin film
Terbium
Films
Crystal structure
Couches minces
CO adsorption
Rare earths
Energy transfer
Copper
Microstructure physique
Oxygen vacancies
Photovoltaic
Si-rich silicon oxide
IR spectroscopy
Semiconductors
GENOMIQUE
Epitaxy
PZT
Rare earth
Structural properties
Hafnium silicates
Friction
Guide d'onde
AFM
Neodymium
Atom probe tomography
Thin films
Radiofrequency magnetron sputtering
Doping
Si nanocluster
Pulvérisation cathodique
Sputtering
Couches minces semi-conductrices
Waveguide
Rare-earth- doped materials
FTIR
Nanostructures
Grazing incidence X-ray diffraction
Fluorescence
Irradiation
Cathodoluminescence
Rare-earth-doped materials
Silicium
ADE-FDTD
M-lines
Infrared absorption
Reactive magnetron sputtering
Hafnium silicate
Nanoparticules
Oxide materials
RF magnetron sputtering
MoS2
Nanoparticles
Silicon
Erbium
Nanostructured materials
Down-conversion
Hillocks
Oxides
Electroluminescence
Computational electromagnetic methods
Al2O3
Matériaux hybrides
SiC
Rare-earth ions
Pulvérisation magnétron radiofréquence
Cerium
Nanostructuring
Quantum-well
Microstructure physics
Silicon nanocrystals
Rare-earth
Citric acid
High-k dielectrics
HR STEM-HAADF
Raman
Liposomes
Microstructure
CoMoS
Laser pyrolysis
Optical amplifiers
Terres rares
Photoluminescence
Waveguides
Feature erasure
Nanostructure
Multilayers
Conductivity
Electron paramagnetic resonance
Luminescence
Raman scattering
Silicon nanoclusters
Magnetron sputtering
Refractive index
Silicon nitride
Phase transition
XRD
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